HTCCRapid-Rate Thermal Cycle Chamber

The Rapid-Rate Thermal Cycle Chamber is ideal for test requiring quick changes in specimen temperature, and covers various applications from JEDEC, IEC standards to screening.
It features new technologies, such as a specimen temperature control function maintaining linear specimen temperature change rates during rapid thermal cycling, and temperature ramp control.

IEC-60749-25 : Semiconductor devices C Temperature cycling

IEC-60068-2-14 Nb : Environmental testing C Change of temperature

IEC-61147-5 : Liquid crystal and solid-state display devices C Environmental, endurance and mechanical test methods

JESD22-A105-B : Solid State Devices, testing quality and reliability C Power and temperature cycling

SAE-J1211 : Automotive components - Recommended environmental practices for electronic equipment design

IPC-9701 : Performance test methods and qualification requirements for surface mount solder attachments

• Uniformity, reproducibility
  Wind simulation allows achieving minimum temperature variations of the specimen, for accurate and quick temperature changes. Specimen temperature ramp rate is 15C/min, air temperature ramp rate is 23C/min.
• Greater temperature ramp control
  High precision of the specimen temperature control achieved thanks to a sensor for temperature specimen measurement, and the embedded high-speed controller.
  In addition:
  - refrigeration capacities increased at low temperatures,
  - minimization of the difference between test area and specimen temperatures,
  - airflow speed uniformity,
  lead to excellent temperature ramp control.
• Selection of the temperature control mode
  Two temperature control modes are available:
  - A specimen temperature control mode meeting ramp rate conditions of JEDEC standard （15C/min.）
  - An air temperature control mode for temperature cycle tests.
• Free access
  Cable ports are equipped on both left and right side, to ease specimen access and wiring.

• Specimen temperature ramp control （Example）
  

  Test conditions High temp. soak : +130C Low temp. soak : -45C Ramp rate : 15C/min. Control point : Front center specimen on the lower level Specimen : Printed Circuit Board, 145 130 mm, 90 pcs. Measurement method 45 specimens placed in two rows on two levels in the specimen basket, with thermocouples attached to the surface of each specimen at the control point.

• Temperature change （Example）
  

  Test conditions High temp. soak : +125C Low temp. soak : -40C Ramp rate : 15C/min. Control point : Air outlet sensor Specimen : Printed Circuit Board, 145 130 mm, 90 pcs. Measurement method As shown on the right, thermocouples are attached to the specimens at twelve measuring point.

• Paperless recorder
• Temperature recorder for future installation
• Specimen temperature measuring thermocouple
• Integrating hour meter with reset
• Overcool protector
• Emergency stop switch
• Cable port rubber plug
• Fixture for securing body
• Chamber dew tray
• Communication cable

• Temperature recorder （digital）
• Recorder terminal
• Temperature attainment output
• Additional overheat protector
• External alarm terminal
• Additional cable port
• Specimen basket / shelf bracket
• Casters
• Communication functions
• Power cord